IEC 60749-4 Ed. 1.0 b:2002, Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

الوصف

IEC 60749-4 Ed. 1.0 b:2002, Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)