IEC 60749-4 Ed. 1.0 b:2002, Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

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IEC 60749-4 Ed. 1.0 b:2002, Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)